ScanTech 2007
The 12th International Conference on Scanning Technology and Process Optimization in the Wood Industry

Atlanta Marriott Downtown
160 Spring Street NW, Atlanta, GA 30303
Phone: 1-404-688-8600; Fax: 1-404-524-5543

TUESDAY, JUNE 19, 2007
7:30-8:20 A.M. - Registration
8:20 A.M. – 5:00 P.M. - Presentations

7:30-8:20 a.m.

8:20 – 8:30 a.m.
Welcome and Introduction
Ryszard Szymani, Director, Wood Machining Institute, Berkeley, California, USA

Session I. Scanning of Logs, Cants and Boards for Cutting Process Optimization

8:30 – 9:10 a.m.
Multisensor Scanning of Logs

Federico Giudiceandrea, Dr.-Ing. & CEO, MiCROTEC GmbH, Brixen (BZ), Italy

9:10 – 9:50 a.m.
Robust Methods for Determining Quality Properties of Wood Using Digital Log End Images
Petri Österberg, Heimo Ihalainen, Risto Ritala, Tampere University of Technology, The Institute of Measurement and Information Technology, Tampere, Finland

9:50 – 10:20 a.m.
Coffee Break

10:20 – 11:00 a.m.
Detecting Juvenile and Knot Wood in Southern Pine Logs with Electrical Impedance Tomography

Jerome E. Cooper1, Philip H. Steele1, Brian K. Mitchell1, C Boden1 and William R. B. Lionheart2; 1Forest Products Department, Mississippi State University, Mississippi State, MS, 2School of Mathematics, University of Manchester, Manchester, UK

11:00 A.M. – 11:40 A.M.
Determining the Value of Internal Log Defect Scanning: A Comparison of Live, Bi-Directional Sawing and Mill Production

Sun Joseph Chang, Professor, School of Renewable Natural Resources, Louisiana State University Agricultural Center, Baton Rouge, LA

11:40 - 1:00 P.M.
Lunch Break

1:00 – 1:40 P.M.
Separate-sided Surface Height Measurement Using a Handheld Profiling Device

Natalie Vadeboncoeur, Gary Schajer, Alex Johnson, David Rickard, Department of Mechanical Engineering, University of British Columbia, Vancouver, Canada

Session II: Lumber Grading and Cut-up Systems

1:40 – 2:20 P.M.
True Shape Scanning for Real Time Detection of Cant Surface Defects

Zarin Pirouz and Jan Brdicko, FP Innovations - Forintek Division, Vancouver, B.C., Canada

2:20 – 3:00 P.M.
Vision Modules: The Technology Is Ready To Grade Lumber
Laurent Poudrier, Operations Manager, Optimization Division, Comact Equipment, Inc., Quebec, QC, Canada

3:00 – 3:20 P.M.
Coffee Break

3:20 – 4:00 P.M.
An Update on the Hardwood Lumber Grading and Process Evaluation System Research
Sang-Mook Lee, Bradley Department of Electrical and Computer Engineering; Philip A. Araman, USDA Forest Service, Southern Research Station; A. Lynn Abbott, Bradley Department of Electrical and Computer Engineering, Virginia Tech, Blacksburg; Matt Winn, USDA Forest Service, Southern Research Station, Brooks Forest Products Center, Virginia Tech, Blacksburg, VA

4:00 – 4:40 P.M.
Open Architecture for High Speed or High Level Detection for Cross Cut Scanning
Shawn Miller, Sales Manager, LuxScan Technologies USA, Troutman, NC

4:40 – 5:00 p.m.
Questions and Answers

5:00 p.m.

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For further information contact:

Ryszard (Richard) Szymani, Director of WMI
Tel: 1-925-943-5240; Fax: 1-925-945-0947